Probe Inspects Surface Finish within CMM Routines

The SFP1 probe option for Renishaw’s Revo five-axis measurement system enables surface finish inspection to be fully integrated within coordinate measurement routines, making the CMM a “single platform” metrology system.

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The SFP1 probe option for Renishaw’s Revo five-axis measurement system enables surface finish inspection to be fully integrated within coordinate measurement routines, making the CMM a “single platform” metrology system.

Offering measurement capability of 6.3 to 0.05 Ra, the probe eliminates the need for handheld surface measurement devices or transporting workpieces to a dedicated surface measuring machine, reducing labor costs and inspection lead times. The system allows automated switching between dimensional measurement and surface finish measurement, with the analysis contained in a single report.

The probe is a fully integrated option for the Revo system, supplied with two dedicated styli, straight and cranked, which are selected via the measurement program control using the system’s modular rack system. The probe incorporates a C axis that, combined with the infinite positioning of the Revo head and choice of stylus holders, enables the probe tip to be automatically oriented to virtually any angle to suit the workpiece, ensuring that the highest quality surface data is acquired. This enables flexible access to component features, combined with the consistency of fully automated CNC control. Using the straight stylus, the SFP1 can perform a measurement trace within a 10-mm-diameter bore to a depth of 100 mm.

A skidded probe with a 2-micron-radius diamond stylus tip, the SFP1 outputs Ra, RMS and raw data formats to the metrology application software via Renishaw’s UCCServer software. The raw data can subsequently be presented to specialized surface analysis software for more detailed reporting.

Callibration of the probe also is automated under the CMM program. A surface finish callibration artifact is mounted on the MRS rack and is measured using the probe. Software then adjusts parameters within the probe in accordance with the artifact’s callibrated value.

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